Results of 1st School of Metrology in Nanotechnologies Concluded
OREANDA-NEWS On 17 November was announced, that on October 27th-31st 2008 “The First School of Metrology and Standardization in Nanotechnologies and Nanoindustry. Nanomaterials” took place at Zarya resort, Moscow region. The School was organized by the Russian Corporation of Nanotechnologies (RUSNANO) together with the Federal Agency on Technical Regulating and Metrology. The School specifically aimed at generation of working proposals in the sphere of metrology, standardization and certification in nanoindustry, and improvement of metrology and standardization skills of specialists working in joint use centers, test centers and laboratories, including participants of the NANOCERTIFICA voluntary certification system for nanoindustry products.
The School was opened with the program addresses from Rusnano deputy director general Andrei Malyshev and deputy directors of the Federal Agency on Technical Regulating and Metrology Vladimir Krutikov and Sergey Pugachev. The School was attended by 159 experts, including 143 participants from 21 regions of the Russian Federation and 16 participants from 7 other countries (China, Belarus, Sweden, USA, Germany, Kyrgyzstan, Netherlands). 36 world renowned lecturers included specialists from leading scientific centers of foreign countries, the Russian Academy of Sciences, Russian Federal Agency on Technical Regulating and Metrology, universities involved in advanced research and development in nanometrology and nanotechnology areas.
The resolution of the School can be found here.
Комментарии